ASTM F1892 - 12 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

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    F1190 Standard Guide for Neutron Irradiation of Unbiased Electronic Components

    Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.

    E170 Terminology Relating to Radiation Measurements and Dosimetry

    E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation

    E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

    E1249 Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

    E1250 Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

    F996 Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

    F1467 Guide for Use of an X-Ray Tester (10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits