ASTM F1467 - 11 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

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    F1892 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

    Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.

    E170 Terminology Relating to Radiation Measurements and Dosimetry

    E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation

    E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

    E1249 Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

    E1894 Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources