ASTM E668 - 13 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

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    E666 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation

    E1026 Standard Practice for Using the Fricke Dosimetry System

    E1249 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

    E1250 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

    E1819 Standard Guide for Environmental Monitoring Plans for Decommissioning of Nuclear Facilities

    E1854 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

    E1894 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources

    E2450 Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments

    F448 Test Method for Measuring Steady-State Primary Photocurrent

    F744M Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

    F773M Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]

    F996 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

    F1190 Standard Guide for Neutron Irradiation of Unbiased Electronic Components

    F1262M Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

    F1467 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

    F1892 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

    F1893 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

    Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.

    E170 Terminology Relating to Radiation Measurements and Dosimetry

    E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation