ASTM International - Standard References

D1879 Standard Practice for Exposure of Adhesive Specimens to Ionizing Radiation

E668 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

E1026 Standard Practice for Using the Fricke Dosimetry System

E1161 Standard Practice for Radiologic Examination of Semiconductors and Electronic Components

E1249 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

E1819 Standard Guide for Environmental Monitoring Plans for Decommissioning of Nuclear Facilities

E1854 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

E1894 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources

E2381 Standard Guide for Dosimetry In Radiation Processing of Fluidized Beds and Fluid Streams

E2450 Standard Practice for Application of CaF₂(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments

F744M Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

F773M Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]

F980 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

F996 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

F1262M Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

F1467 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

F1892 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

		ASTM E666 - 09 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation Citing ASTM Standards Citation data is made available by participants in CrossRefs Cited-by Linking service. A comprehensive list of citations to this standard are listed here. D1879 Standard Practice for Exposure of Adhesive Specimens to Ionizing Radiation E668 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices E1026 Standard Practice for Using the Fricke Dosimetry System E1161 Standard Practice for Radiologic Examination of Semiconductors and Electronic Components E1249 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources E1819 Standard Guide for Environmental Monitoring Plans for Decommissioning of Nuclear Facilities E1854 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts E1894 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources E2381 Standard Guide for Dosimetry In Radiation Processing of Fluidized Beds and Fluid Streams E2450 Standard Practice for Application of CaF₂(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments F744M Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric] F773M Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric] F980 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices F996 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics F1262M Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) F1467 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits F1892 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.

ASTM E666 - 09 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation