ASTM E666 - 14 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation


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    D1879 Standard Practice for Exposure of Adhesive Specimens to Ionizing Radiation

    E668 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

    E1026 Standard Practice for Using the Fricke Dosimetry System

    E1161 Standard Practice for Radiologic Examination of Semiconductors and Electronic Components

    E1249 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

    E1819 Standard Guide for Environmental Monitoring Plans for Decommissioning of Nuclear Facilities

    E1854 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

    E1894 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources

    E2381 Standard Guide for Dosimetry In Radiation Processing of Fluidized Beds and Fluid Streams

    E2450 Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments

    F744M Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

    F773M Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]

    F980 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

    F996 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

    F1262M Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

    F1467 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

    F1892 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices


    Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.

    E170 Terminology Relating to Radiation Measurements and Dosimetry

    E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

    E1249 Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources