ASTM E2735 - 14 Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments

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    E995 Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

    E996 Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

    E1078 Guide for Specimen Preparation and Mounting in Surface Analysis

    E1127 Guide for Depth Profiling in Auger Electron Spectroscopy

    E1217 Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers

    E1523 Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy

    E1577 Guide for Reporting of Ion Beam Parameters Used in Surface Analysis

    E1634 Guide for Performing Sputter Crater Depth Measurements

    E1636 Practice for Analytically Describing Depth-Profile and Linescan-Profile Data by an Extended Logistic Function

    E1829 Guide for Handling Specimens Prior to Surface Analysis

    E2108 Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer