ASTM International - Standard References

		ASTM E2530 - 06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps Citing ASTM Standards Citation data is made available by participants in CrossRefs Cited-by Linking service. A comprehensive list of citations to this standard are listed here. E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer E2245 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard. There are currently no reference documents for this standard.

ASTM E2530 - 06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps