ASTM E2444 - 11e1 Terminology Relating to Measurements Taken on Thin, Reflecting FilmsCiting ASTM Standards
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E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer E2245 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer Referenced ASTM Standards
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