ASTM E2382 - 04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
Citing ASTM Standards
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E2859 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
Referenced ASTM Standards
The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E1813 Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy