ASTM E2245 - 11e1 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer


    Citing ASTM Standards Citation data is made available by participants in CrossRefs Cited-by Linking service. A comprehensive list of citations to this standard are listed here.

    E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer

    E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer

    E2444 Terminology Relating to Measurements Taken on Thin, Reflecting Films

    F2603 Standard Guide for Interpreting Images of Polymeric Tissue Scaffolds


    Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.

    E2244 Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer

    E2246 Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer

    E2444 Terminology Relating to Measurements Taken on Thin, Reflecting Films

    E2530 Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps