ASTM E1894 - 08 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray SourcesCiting ASTM Standards
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F526 Standard Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests F744M Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric] F773M Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric] F980 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices F996 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics F1467 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits F1893 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices Referenced ASTM Standards
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