ASTM E1894 - 08 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
Citing ASTM Standards Citation data is made available by participants in CrossRefs Cited-by Linking service. A comprehensive list of citations to this standard are listed here.
F526 Standard Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests
F744M Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
F773M Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]
F980 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
F996 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
F1467 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
F1893 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.