C149 Standard Test Method for Thermal Shock Resistance of Glass Containers

E1855 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

E2450 Standard Practice for Application of CaF_{2}(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments

F980 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

F1190 Standard Guide for Neutron Irradiation of Unbiased Electronic Components

F3049 Standard Guide for Characterizing Properties of Metal Powders Used for Additive Manufacturing Processes

F3049 Standard Guide for Characterizing Properties of Metal Powders Used for Additive Manufacturing Processes

F3049 Standard Guide for Characterizing Properties of Metal Powders Used for Additive Manufacturing Processes

E170 Terminology Relating to Radiation Measurements and Dosimetry

E181 Test Methods for Detector Calibration and Analysis of Radionuclides

E261 Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques

E262 Test Method for Determining Thermal Neutron Reaction Rates and Thermal Neutron Fluence Rates by Radioactivation Techniques

E263 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Iron

E264 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel

E265 Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32

E393 Test Method for Measuring Reaction Rates by Analysis of Barium-140 From Fission Dosimeters

E481 Test Method for Measuring Neutron Fluence Rates by Radioactivation of Cobalt and Silver

E482 Guide for Application of Neutron Transport Methods for Reactor Vessel Surveillance, E706 (IID)

E496 Test Method for Measuring Neutron Fluence and Average Energy from 3H(d,n) 4He Neutron Generators by Radioactivation Techniques

E523 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Copper

E526 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Titanium

E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation

E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

E704 Test Method for Measuring Reaction Rates by Radioactivation of Uranium-238

E705 Test Method for Measuring Reaction Rates by Radioactivation of Neptunium-237

E720 Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics

E721 Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics

E722 Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

E798 Practice for Conducting Irradiations at Accelerator-Based Neutron Sources

E844 Guide for Sensor Set Design and Irradiation for Reactor Surveillance, E 706 (IIC)

E944 Guide for Application of Neutron Spectrum Adjustment Methods in Reactor Surveillance, E 706 (IIA)

E1018 Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E706 (IIB)

E1249 Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

E1250 Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

E1297 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium

E1855 Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

E2005 Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields

E2450 Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments

F980 Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

F1190 Guide for Neutron Irradiation of Unbiased Electronic Components