ASTM E1636 - 10 Standard Practice for Analytically Describing Depth-Profile and Linescan-Profile Data by an Extended Logistic Function


    Citing ASTM Standards Citation data is made available by participants in CrossRefs Cited-by Linking service. A comprehensive list of citations to this standard are listed here.

    E1127 Standard Guide for Depth Profiling in Auger Electron Spectroscopy

    E2735 Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments


    Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.

    E673 Terminology Relating to Surface Analysis

    E1127 Guide for Depth Profiling in Auger Electron Spectroscopy

    E1162 Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)

    E1438 Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS