ASTM E1636 - 10 Standard Practice for Analytically Describing Depth-Profile and Linescan-Profile Data by an Extended Logistic Function
Citing ASTM Standards
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E1127 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
Referenced ASTM Standards
The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E673 Terminology Relating to Surface Analysis
E1127 Guide for Depth Profiling in Auger Electron Spectroscopy
E1162 Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
E1438 Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS