ASTM E1438 - 11 Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
Citing ASTM Standards
Citation data is made available by participants in CrossRefs Cited-by Linking service. A comprehensive list of citations to this standard are listed here.
E1636 Standard Practice for Analytically Describing Depth-Profile and Linescan-Profile Data by an Extended Logistic Function
Referenced ASTM Standards
The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E673 Terminology Relating to Surface Analysis