ASTM E1250 - 10 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
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E1249 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
E1854 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
F1190 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
F1892 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
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