ASTM E1250 - 10 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic DevicesCiting ASTM Standards
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E1249 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources E1854 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts F1190 Standard Guide for Neutron Irradiation of Unbiased Electronic Components F1892 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices Referenced ASTM Standards
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