ASTM International - Standard References

E666 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation

E1250 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

E1854 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

E1894 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources

F996 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

F1190 Standard Guide for Neutron Irradiation of Unbiased Electronic Components

F1467 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

F1892 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

		ASTM E1249 - 10 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources Citing ASTM Standards Citation data is made available by participants in CrossRefs Cited-by Linking service. A comprehensive list of citations to this standard are listed here. E666 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation E1250 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices E1854 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts E1894 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources F996 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics F1190 Standard Guide for Neutron Irradiation of Unbiased Electronic Components F1467 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits F1892 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.

ASTM E1249 - 10 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources