ASTM E1249 - 10 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
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E666 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
E1250 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
E1854 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
E1894 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
F996 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
F1190 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
F1467 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
F1892 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
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