Research Report RR:F01-1014
An interlaboratory study was conducted by six laboratories testing nine samples to establish a precision statement for test method F996.

Pages:	296		Published:	July 2008
Delivery Format:			PDF Download

Product	Cost
Research Report Only:	$70.00
F996 + Research Report:	$84.00

Related Standards:

F996-11 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

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Committee F01 on Electronics

Subcommittee F01.11 on Nuclear and Space Radiation Effects