Standards
Back to Molecular Spectroscopy and Separation Science Standards

ASTM E673 - 03


ASTM E673 - 03 Standard Terminology Relating to Surface Analysis


Active Standard ASTM E673 Developed by Subcommittee: E42.02 |Book of Standards Volume: 03.06

more info 10 pages $ 37.00
more info 10 pages $ 37.00
why redline? 20 pages $ 44.40

Historical(view previous versions of standard) ASTM License Agreement

Description Related Products

ASTM E673

1. Scope

1.1 This terminology is related to the various disciplines involved in surface analysis.

1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).


Index Terms

terminology; surface analysis; ICS Number Code 01.040.17; 17.040.20

DOI: 10.1520/E0673-03

ASTM International is a member of CrossRef.

Citing ASTM Standards

[Back to Top]
Standards Tracker

Standards Subscriptions


Back to Molecular Spectroscopy and Separation Science Standards