SUPERSEDED (click for Active standard)
| ||Format||Pages||Price|| |
|4||$45.60||  ADD TO CART|
1.1 This guide covers supplementary guidelines for plane-strain fracture toughness testing of aluminum products for which complete stress relief is not practicable. Guidelines for recognizing when residual stresses may be significantly biasing test results are presented, as well as methods for minimizing the effects of residual stress during testing. This guide also provides guidelines for correction and interpretation of data produced during the testing of these products. Test Method E 399 is the standard test method to be used for plane-strain fracture toughness testing of aluminum alloys.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
ANSI StandardANSI H35.1 Alloy and Temper Designations for Aluminum Available from American National Standards Institute (ANSI), 25 W. 43rd St., 4th Floor, New York, NY 10036, http://www.ansi.org.
E399 Test Method for Linear-Elastic Plane-Strain Fracture Toughness K Ic of Metallic Materials
E561 Test Method for K-R Curve Determination
E1823 Terminology Relating to Fatigue and Fracture Testing
ISO StandardISO 12737 Metallic Materials-Determination of Plane Strain Fracture Toughness Available from International Organization for Standardization (ISO), 1 rue de Varemb, Case postale 56, CH-1211, Geneva 20, Switzerland, http://www.iso.ch.
ICS Number Code 77.150.99 (Other products of non-ferrous metals)
UNSPSC Code 11172000(Aluminum based alloys)
ASTM B909-00(2006), Standard Guide for Plane Strain Fracture Toughness Testing of Non-Stress Relieved Aluminum Products, ASTM International, West Conshohocken, PA, 2006, www.astm.orgBack to Top