Standard Historical Last Updated: Aug 16, 2017 Track Document
ASTM B878-97

Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors B0878-97 ASTM|B0878-97|en-US Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors Standard new BOS Vol. 02.04 Committee B02
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Scope

1.1 This test method describes equipment and techniques for detecting contact resistance transients yielding resistances greater than a specified value and lasting for at least a specified minimum duration.

1.2 The minimum durations specified in this standard are 1, 10, and 50 nanoseconds (ns).

1.3 The minimum sample resistance required for an event detection in this standard is 10.

1.4 An ASTM guide for measuring electrical contact transients of various durations is available as Guide B 854.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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Details
Book of Standards Volume: 02.04
Developed by Subcommittee: B02.11
Pages: 4
DOI: 10.1520/B0878-97