SUPERSEDED (click for Active standard)
| ||Format||Pages||Price|| |
|8||$52.80||  ADD TO CART|
1.1 This test method covers the use of X-ray spectrometry to determine thickness of metallic and some nonmetallic coatings.
1.2 The maximum measurable thickness for a given coating is that thickness beyond which the intensity of the characteristic secondary X radiation from the coating or the substrate is no longer sensitive to small changes in thickness.
1.3 This test method measures the mass of coating per unit area, which can also be expressed in units of linear thickness provided that the density of the coating is known.
1.4 Problems of personnel protection against radiation generated in an X-ray tube or emanating from a radioisotope source are not covered by this test method. For information on this important aspect, reference should be made to current documents of the National Committee on Radiation Protection and Measurement, Federal Register, Nuclear Regulatory Commission, National Institute of Standards and Technology (formerly the National Bureau of Standards), and to state and local codes if such exist.
1.5 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E135 Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials
International StandardISO 3497 Metallic Coatings--Measurement of Coating Thickness--X-ray Spectrometric Methods
ICS Number Code 17.040.20 (Properties of surfaces)
|Link to Active (This link will always route to the current Active version of the standard.)|
ASTM B568-98, Standard Test Method for Measurement of Coating Thickness by X-Ray Spectrometry, ASTM International, West Conshohocken, PA, 1998, www.astm.orgBack to Top