1.1 This test method covers determination of ductility utilizing Epstein test strips and a bending device for bending the strip over a predetermined radius. It is intended for commercial silicon-bearing steel sheet or strip of nonoriented types in the thickness range from 0.010 in. (0.25 mm) to 0.031 in. (0.79 mm), inclusive.
1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
1.3 The values stated in modified cgs are to be regarded as the standard. The values in parentheses are for information only.
ductility; electrical; nonoriented; silicon; steel;
ICS Number Code 77.140.50 (Flat steel products and semi-products)
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Citing ASTM Standards
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