ASTM International Technical Committee F01 Publications

		Technical Committees / Committee F01 / Committee Publications Special Technical Publications (STPs) STP 1382 Gate Dielectric Integrity: Material, Process, and Tool Qualification STP 1340 Recombination Lifetime Measurement in Silicon STP 1141 Laser-Induced Damage in Optical Materials STP 1117 Laser Induced Damage in Optical Materials STP 1113 Food Packaging Technology STP 1038 Laser Induced Damage in Optical Materials: 1987 STP 1028 Laser Induced Damage in Optical Materials: 1986 STP 1015 Laser Induced Damage in Optical Materials STP 990 Semiconductor Fabrication: Technology and Metrology STP 960 Emerging Semiconductor Technology STP 912 Current Technologies in Flexible Packaging STP 911 Laser Induced Damage in Optical Materials STP 850 Semiconductor Processing STP 800 Medical Devices: Measurements, Quality Assurance and Standards STP 799 Laser Induced Damage in Optical Materials: 1981 STP 759 Laser Induced Damage in Optical Materails: 1980 STP 712 Lifetime Factors in Silicon STP 689 Laser Induced Damage in Optical Materials: 1978 STP 666 Optical Interferograms—Reduction and Interpretation STP 572 Semiconductor Measurement Technology: Spreading Resistance Symposium STP 469 Damage in Laser Glass STP 342 Symposium on Cleaning and Materials Processing for Electronics and Space Apparatus STP 300 Materials and Electron Device Processing