Technical Committees / Committee F01 / Committee Publications

Journal of Testing and Evaluation

• Evaluation of A Humidity Sensor for Use in An Environment Exposed to Radiation
• Surface Roughness Measurement Using Laser Speckle Statistical Analysis
• Application of 3-D Laser Scanning Technique to Slope Movement Monitoring
• Failure Analysis Using Microfocus X-ray Imaging
• Testing and Design of CMOS D-Latches
• Pulse Current Automatic Electro-Optical Characterization of the Laser Diode
• Laser Evaluation of Cutting Angle and Surface Finish in Scalpel Blades
• Room Temperature Capacitance and Dissipation Factor Measurement of Chip Capacitors—An Interlaboratory Evaluation
• Strength Reduction in Thin Aluminum Alloy Sheets by Laser Irradiation
• Correlation Between Leaking Glass/Metal Seals and Wire Defects in Dry Reed Contacts
• A Technique for Examining Submicron Particulate Matter on Semiconductor Device Wafers
• Laser-Heating-Induced Failure of Metal Alloys Under Constant Stress
• Application of the Laser Beam Technique to the Improvement of Metal Strength
• Acquisition of Computer Aided Design/Analysis Models for Semiconductors
• Silicon Epitaxial Thickness Measurements: Why and How
• Epitaxial Resistivity
• Materials for Diffusion and Epitaxy
• Measurements in Silicon Planar Technology: Mechanical Properties of Semiconductor Surfaces