|
Technical Committees / Committee E04 on Metallography according to ASTM E112, E930, E1181, E1383 and other Methods November 17, 2010 San Antonio, TX Grain Size by EBSD Stuart Wright, EDAX John Friel, Temple University Scott Sitzman, Oxford Instruments Grain Characterization of Aluminum DC Cast Ingot and Downstream Products Andris Innus & Yves Raymond, Analytical Technologies Group The Bias in Planimetric Procedure According to ASTM E112 and Correct Method LI Heping & ZHOU Xing, Baosteel Industry Inspection Corporation Challenges of Prior Austenite Grain Size Determination in Vacuum-melted Steels Clement Forget, Latrobe Specialty Steel Company Myriam Savard, Clemex Addressing Problems with Revealing Prior Austenite Grain Boundaries Walt Moorhead and Ick Kayafas, Product Evaluation Systems, Inc. Chris Bagnall, MCS Associates, Inc. | ||