**Showing results 1-13 of 13 matching ACTIVE standards under the jurisdiction of F01.11 F01 Home**

F448-11 Test Method for Measuring Steady-State Primary Photocurrent

See also WK53621 proposed revision

F773M-16 Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)

See also WK53622 proposed revisionSee also WK53623 proposed revision

F1190-11 Standard Guide for Neutron Irradiation of Unbiased Electronic Components

F1263-11 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

F1892-12 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

**0 matching Proposed New Standards under the jurisdiction of F01.11 F01 Home**

**Showing Results 1-11 of 11 matching WITHDRAWN standards under the jurisdiction of F01.11 F01 Home**

F616-92 Standard Test Method for Measuring MOSFET Drain Leakage Current

F617-00 Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006)

F676-97(2003) Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)

F769-00 Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006)

F773-92 Practice for Measuring Dose Rate Response of Linear Integrated Circuits