Technical Committees / Committee F01 /


Committee F01.10 on Contamination Control


Subcommittees and Standards

Showing results 1-11 of 11 matching ACTIVE standards under the jurisdiction of F01.10     F01 Home

F1094-87(2005) Standard Test Methods for Microbiological Monitoring of Water Used for Processing Electron and Microelectronic Devices by Direct Pressure Tap Sampling Valve and by the Presterilized Plastic Bag Method

F1372-93(2005) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components

F1373-93(2005) Standard Test Method for Determination of Cycle Life of Automatic Valves for Gas Distribution System Components

F1374-92(2005) Standard Test Method for Ionic/Organic Extractables of Internal Surfaces-IC/GC/FTIR for Gas Distribution System Components

F1375-92(2005) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components

F1376-92(2005) Standard Guide for Metallurgical Analysis for Gas Distribution System Components

F1394-92(2005) Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves

F1396-93(2005) Standard Test Method for Determination of Oxygen Contribution by Gas Distribution System Components

F1397-93(2005) Standard Test Method for Determination of Moisture Contribution by Gas Distribution System Components

F1398-93(2005) Standard Test Method for Determination of Total Hydrocarbon Contribution by Gas Distribution System Components

F1438-93(2005) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components

0 matching Proposed New Standards under the jurisdiction of F01.10     F01 Home

F1095-88(1994)E01 Test Method for Rapid Enumeration of Bacteria in Electronics-Grade Purified Water Systems by Direct-Count Epifluorescence Microscopy (Withdrawn 2001)

F1226-89(1994)e1 Standard Test Method for Calibration of Liquid-Borne Particle Counters for Submicrometer Particle Sizing (Withdrawn 2002)

F1228-89(1994)E01 Test Method for Oxidizable (Organic) Carbon on Wafer Surfaces (By Persulfate) (Withdrawn 2001)



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