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Technical Committees / Committee E42/ List of Subcommittees and Standards Committee E42 on Surface Analysis Subcommittees and Standards
Standards under the jurisdiction of E42 Each main committee in ASTM International is composed of subcommittees that address specific segments within the general subject area covered by the technical committee. Click on the subcommittee links below to see the title of existing standards for each subcommittee. Then, click on the resulting titles to see the standard's scope, referenced documents, and more. E42.02 TerminologyE42.03 Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy E42.06 SIMS E42.08 Ion Beam Sputtering E42.13 Vacuum Technology E42.14 STM/AFM E42.15 Electron Probe Microanalysis/Electron Microscopy E42.90 Executive E42.91 Awards E42.92 US TAG ISO/TC 201 E42.94 US TAG ISO/TC 112 E42.96 US TAG ISO/TC 202 | ||
