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STP 536


Progress in Flaw Growth and Fracture Toughness Testing


Editor(s): J Kaufman; J Swedlow; H Corten; J Srawley; R Heyer, E Wessel; G Irwin

Pages: 486

Published: 1973

Soft Cover

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Progress in Flaw Growth and Fracture Toughness Testing
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STOCK# STP536

STP536-C01   STP536-C02   STP536-C03   STP536-C04   STP536-C05   STP536-C06   STP536-C07   STP536-F01   STP536-F02   STP536-R01   STP536-R02   STP536-R03   STP536-SN   STP 536   STP536   STP536   STP536   STP 536