ASTM Volume 10.04, April 2013

    Electronics; Declarable Substances in Materials; 3D Imaging Systems

    Table of Contents

    E2544-11a Standard Terminology for Three-Dimensional (3D) Imaging Systems

    E2641-09 Standard Practice for Best Practices for Safe Application of 3D Imaging Technology

    E2807-11 Standard Specification for 3D Imaging Data Exchange, Version 1.0

    F7-95(2011) Standard Specification for Aluminum Oxide Powder

    F15-04(2009) Standard Specification for Iron-Nickel-Cobalt Sealing Alloy

    F16-12 Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps

    F18-12 Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices

    F19-11 Standard Test Method for Tension and Vacuum Testing Metallized Ceramic Seals

    F29-97(2012) Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications

    F30-96(2012) Standard Specification for Iron-Nickel Sealing Alloys

    F31-12 Standard Specification for Nickel-Chromium-Iron Sealing Alloys

    F44-95(2011) Standard Specification for Metallized Surfaces on Ceramic

    F72-06 Standard Specification for Gold Wire for Semiconductor Lead Bonding

    F73-96(2009) Standard Specification for Tungsten-Rhenium Alloy Wire for Electron Devices and Lamps

    F76-08 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

    F83-71(2009) Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters

    F85-76(2009) Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes

    F96-77(2010) Standard Specification for Electronic Grade Alloys of Copper and Nickel in Wrought Forms

    F106-12 Standard Specification for Brazing Filler Metals for Electron Devices

    F180-94(2010)e1 Standard Test Method for Density of Fine Wire and Ribbon Wire for Electronic Devices

    F204-76(2009) Standard Test Method for Surface Flaws in Tungsten Seal Rod and Wire

    F205-94(2010)e1 Standard Test Method for Measuring Diameter of Fine Wire by Weighing

    F219-96(2009) Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps

    F256-05(2010) Standard Specification for Chromium-Iron Sealing Alloys with 18 or 28 Percent Chromium

    F269-60(2009) Standard Test Method for Sag of Tungsten Wire

    F288-96(2009) Standard Specification for Tungsten Wire for Electron Devices and Lamps

    F289-96(2009) Standard Specification for Molybdenum Wire and Rod for Electronic Applications

    F290-94(2010) Standard Specification for Round Wire for Winding Electron Tube Grid Laterals

    F364-96(2009) Standard Specification for Molybdenum Flattened Wire for Electron Tubes

    F375-89(2010) Standard Specification for Integrated Circuit Lead Frame Material

    F390-11 Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array

    F448-11 Test Method for Measuring Steady-State Primary Photocurrent

    F458-13 Standard Practice for Nondestructive Pull Testing of Wire Bonds

    F459-13 Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds

    F487-13 Standard Specification for Fine Aluminum–1???% Silicon Wire for Semiconductor Lead-Bonding

    F584-06e1 Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire

    F615M-95(2008) Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)

    F744M-10 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

    F773M-10 Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]

    F980-10 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

    F996-11 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

    F1094-87(2012) Standard Test Methods for Microbiological Monitoring of Water Used for Processing Electron and Microelectronic Devices by Direct Pressure Tap Sampling Valve and by the Presterilized Plastic Bag Method

    F1190-11 Standard Guide for Neutron Irradiation of Unbiased Electronic Components

    F1192-11 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

    F1238-95(2011) Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications

    F1262M-95(2008) Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

    F1263-11 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

    F1269-13 Standard Test Methods for Destructive Shear Testing of Ball Bonds

    F1367-98(2011) Standard Specification for Chromium Sputtering Targets for Thin Film Applications

    F1372-93(2012) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components

    F1373-93(2012) Standard Test Method for Determination of Cycle Life of Automatic Valves for Gas Distribution System Components

    F1374-92(2012) Standard Test Method for Ionic/Organic Extractables of Internal Surfaces-IC/GC/FTIR for Gas Distribution System Components

    F1375-92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components

    F1376-92(2012) Standard Guide for Metallurgical Analysis for Gas Distribution System Components

    F1394-92(2012) Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves

    F1396-93(2012) Standard Test Method for Determination of Oxygen Contribution by Gas Distribution System Components

    F1397-93(2012) Standard Test Method for Determination of Moisture Contribution by Gas Distribution System Components

    F1398-93(2012) Standard Test Method for Determination of Total Hydrocarbon Contribution by Gas Distribution System Components

    F1404-92(2007) Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique

    F1438-93(2012) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components

    F1466-99(2010) Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications

    F1467-11 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

    F1512-94(2011) Standard Practice for Ultrasonic C-Scan Bond Evaluation of Sputtering Target-Backing Plate Assemblies

    F1513-99(2011) Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications

    F1578-07 Standard Test Method for Contact Closure Cycling of a Membrane Switch

    F1593-08 Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum by High Mass-Resolution Glow-Discharge Mass Spectrometer

    F1594-95(2011) Standard Specification for Pure Aluminum (Unalloyed) Source Material for Vacuum Coating Applications

    F1595-00(2012) Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches

    F1596-07 Standard Test Method for Exposure of Membrane Switches to Temperature and Relative Humidity

    F1598-95(2007) Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method)

    F1661-09 Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch

    F1662-10 Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch

    F1663-09 Standard Test Method for Determining the Capacitance of a Membrane Switch

    F1680-07a Standard Test Method for Determining Circuit Resistance of a Membrane Switch

    F1681-07a Standard Test Method for Determining Current Carrying Capacity of a Conductor as Part of a Membrane Switch Circuit

    F1683-09 Standard Practice for Creasing or Bending a Membrane Switch, Membrane Switch Flex Tail Assembly or Membrane Switch Component

    F1684-06(2011) Standard Specification for Iron-Nickel and Iron-Nickel-Cobalt Alloys for Low Thermal Expansion Applications

    F1689-05(2012) Standard Test Method for Determining the Insulation Resistance of a Membrane Switch

    F1709-97(2008) Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications

    F1710-08 Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer

    F1711-96(2008) Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe Method

    F1761-00(2011) Standard Test Method for Pass Through Flux of Circular Magnetic Sputtering Targets

    F1762-07 Standard Practice for Exposing a Membrane Switch to Variation in Atmospheric Pressure

    F1812-09 Standard Test Method for Determining the Effectiveness of Membrane Switch ESD Shielding

    F1842-09 Standard Test Method for Determining Ink or Coating Adhesion on Plastic Substrates for Membrane Switch Applications

    F1843-09 Standard Practice for Sample Preparation of Transparent Plastic Films used on Membrane Switch Overlays for Specular Gloss Measurements

    F1844-97(2008) Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage

    F1845-08 Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer

    F1892-12 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

    F1893-11 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

    F1894-98(2011) Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness

    F1895-10a Practice for Submersion of a Membrane Switch

    F1896-10 Test Method for Determining the Electrical Resistivity of a Printed Conductive Material

    F1995-12 Standard Test Method for Determining the Shear Force of a Surface Mount Device (SMD) in a Membrane Switch

    F1996-06 Standard Test Method for Silver Migration for Membrane Switch Circuitry

    F2072-01(2007) Standard Practice for Hosedown of a Membrane Switch

    F2073-01(2006) Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch

    F2112-02(2011) Standard Terminology for Membrane Switches

    F2113-01(2011) Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications

    F2187-02(2011) Standard Test Method for Determining the Effect of Random Frequency Vibration on a Membrane Switch or Membrane Switch Assembly

    F2188-02(2011) Standard Test Method for Determining the Effect of Variable Frequency Vibration on a Membrane Switch or Membrane Switch Assembly

    F2357-10 Standard Test Method for Determining the Abrasion Resistance of Inks and Coatings on Membrane Switches Using the Norman Tool "RCA" Abrader

    F2359-04(2011) Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source

    F2360-08 Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source

    F2405-04(2011) Standard Test Method for Trace Metallic Impurities in High Purity Copper by High-Mass-Resolution Glow Discharge Mass Spectrometer

    F2576-11 Standard Terminology Relating to Declarable Substances in Materials

    F2577-06 Standard Guide for Assessment of Materials and Products for Declarable Substances

    F2592-10 Standard Test Method for Measuring the Force-Displacement of a Membrane Switch

    F2617-08e1 Standard Test Method for Identification and Quantification of Chromium, Bromine, Cadmium, Mercury, and Lead in Polymeric Material Using Energy Dispersive X-ray Spectrometry

    F2725-11 Standard Guide for European Union's Registration, Evaluation, and Authorization of Chemicals (REACH) Supply Chain Information Exchange

    F2749-09 Standard Test Method for Determining the Effects of Creasing a Membrane Switch or Assembly

    F2750-09 Standard Test Method for Determining the Effects of Bending a Membrane Switch or Assembly

    F2771-10 Standard Test Method for Determining the Luminance Curve of an Electroluminescent Lamp at Ambient Conditions

    F2792-12a Standard Terminology for Additive Manufacturing Technologies,

    F2853-10e1 Standard Test Method for Determination of Lead in Paint Layers and Similar Coatings or in Substrates and Homogenous Materials by Energy Dispersive X-Ray Fluorescence Spectrometry Using Multiple Monochromatic Excitation Beams

    F2865-13 Standard Guide for Classifying the Degrees of Ingress of Dust and Water into a Membrane Switch

    F2866-11 Standard Test Method for Flammability of a Membrane Switch in Defined Assembly

    F2915-12 Standard Specification for Additive Manufacturing File Format (AMF) Version 1.1

    F2921-11e2 Standard Terminology for Additive Manufacturing—Coordinate Systems and Test Methodologies

    F2924-12a Standard Specification for Additive Manufacturing Titanium-6 Aluminum-4 Vanadium with Powder Bed Fusion

    F2931-11 Standard Guide for Analytical Testing of Substances of Very High Concern in Materials and Products

    F2964-12 Standard Test Method for Determining the Uniformity of the Luminance of an Electroluminescent Lamp or Other Diffuse Lighting Device

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    - 2013
       Standards: 120
       Pages: 772

    - 2012
       Standards: 119
       Pages: 730